Selected Transition Time Adjustment for Tolerating Crosstalk Effects on Network-on-Chip Interconnects.

Yinghua Min

Ying Zhang 0040 Huawei Li 0001 Yinghua Min Xiaowei Li 0001 Selected Transition Time Adjustment for Tolerating Crosstalk Effects on Network-on-Chip Interconnects. 1787-1800 2011 19 IEEE Trans. Very Large Scale Integr. Syst. 10 https://doi.org/10.1109/TVLSI.2010.2062201 db/journals/tvlsi/tvlsi19.html#ZhangLML11

Ruilian Zhao Michael R. Lyu Yinghua Min Automatic string test data generation for detecting domain errors. 209-236 2010 20 Softw. Test. Verification Reliab. 3 https://doi.org/10.1002/stvr.414 db/journals/stvr/stvr20.html#ZhaoLM10

Jie Wang Huawei Li 0001 Yinghua Min Xiaowei Li 0001 Huaguo Liang Impact of Hazards on Pattern Selection for Small Delay Defects. 49-54 2009 PRDC https://doi.org/10.1109/PRDC.2009.17 https://doi.ieeecomputersociety.org/10.1109/PRDC.2009.17 conf/prdc/2009 db/conf/prdc/prdc2009.html#WangLMLL09 Guangxing Zhang Gaogang Xie Jianhua Yang Yinghua Min Zhaomin Zhou Xiaodong Duan Accurate Online Traffic Classification with Multi-Phases Identification Methodology. 141-146 2008 CCNC https://doi.org/10.1109/ccnc08.2007.39 conf/ccnc/2008 db/conf/ccnc/ccnc2008.html#ZhangXYMZD08 Jacob Abraham Salvador Mir Yinghua Min Jeremy Wang Cheng-Wen Wu Test Education in the Global Economy. 53 2007 ATS https://doi.org/10.1109/ATS.2007.110 conf/ats/2007 db/conf/ats/ats2007.html#ChengAMMWW07 Kun Xie 0001 Yinghua Min Dafang Zhang 0001 Jigang Wen Gaogang Xie A Scalable Bloom Filter for Membership Queries. 543-547 2007 GLOBECOM https://doi.org/10.1109/GLOCOM.2007.107 conf/globecom/2007 db/conf/globecom/globecom2007.html#XieMZWX07 Gaogang Xie Guangxing Zhang Jianhua Yang Yinghua Min Valérie Issarny Alberto Conte Survey on Traffic of Metro Area Network with Measurement On-Line. 666-677 2007 conf/teletraffic/2007 ITC https://doi.org/10.1007/978-3-540-72990-7_59 db/conf/teletraffic/itc2007.html#XieZYMIC07

Jie Wu 0001 Feng Gao Zhongcheng Li Yinghua Min Optimal, and reliable communication in hypercubes using extended safety vectors. 402-411 2005 54 IEEE Trans. Reliab. 3 https://doi.org/10.1109/TR.2005.853439 db/journals/tr/tr54.html#WuGLM05

Yuan-sheng Luo Dafang Zhang Yinghua Min An Improved Scheme of Index-Based Checkpointing. 167-174 2005 conf/prdc/2005 PRDC https://doi.org/10.1109/PRDC.2005.17 https://doi.ieeecomputersociety.org/10.1109/PRDC.2005.17 db/conf/prdc/prdc2005.html#LuoZM05

Debesh K. Das Hideo Fujiwara Yungang Li Yinghua Min Shiyi Xu Yervant Zorian Design & Test Education in Asia. 331-338 2004 21 IEEE Des. Test Comput. 4 db/journals/dt/dt21.html#DasFLMXZ04

Jianhui Jiang Yinghua Min Chenglian Peng Fault-Tolerant Systems with Concurrent Error-Locating Capability. 190-200 2003 18 J. Comput. Sci. Technol. 2 https://doi.org/10.1007/BF02948884 db/journals/jcst/jcst18.html#JiangMP03

Jishun Kuang Zhiqiang Yang Qijian Zhu Yinghua Min IDDT: Fundamentals and Test Generation. 299-307 2003 18 J. Comput. Sci. Technol. 3 https://doi.org/10.1007/BF02948899 db/journals/jcst/jcst18.html#KuangYZM03

Zhigang Yin Yinghua Min Xiaowei Li 0001 Huawei Li 0001 A Novel RT-Level Behavioral Description Based ATPG Method. 308-317 2003 18 J. Comput. Sci. Technol. 3 https://doi.org/10.1007/BF02948900 db/journals/jcst/jcst18.html#YinMLL03

Ruilian Zhao Michael R. Lyu Yinghua Min Domain Testing Based on Character String Predicate. 96-101 2003 conf/ats/2003 Asian Test Symposium https://doi.org/10.1109/ATS.2003.1250790 https://doi.ieeecomputersociety.org/10.1109/ATS.2003.1250790 db/conf/ats/ats2003.html#ZhaoLM03 Yinghua Min Jishun Kuang Xiaoyan Niu At-Speed Current Testing. 396-399 2003 conf/ats/2003 Asian Test Symposium https://doi.org/10.1109/ATS.2003.1250844 https://doi.ieeecomputersociety.org/10.1109/ATS.2003.1250844 db/conf/ats/ats2003.html#MinKN03 Ruilian Zhao Michael R. Lyu Yinghua Min A New Software Testing Approach Based on Domain Analysis of Specifications and Programs. 60-70 2003 conf/issre/2003 ISSRE https://doi.org/10.1109/ISSRE.2003.1251031 https://doi.ieeecomputersociety.org/10.1109/ISSRE.2003.1251031 db/conf/issre/issre2003.html#ZhaoLM03

Zuying Luo Yinghua Min Shiyuan Yang Xiaowei Li 0001 The monotonic increasing relationship between average powers of CMOS VLSI circuits with and without delay and its applications. 401-415 2002 45 Sci. China Ser. F Inf. Sci. 6 https://doi.org/10.1360/02yf9035 db/journals/chinaf/chinaf45.html#LuoMY002

Huawei Li 0001 Yinghua Min Zhongcheng Li Clustering of behavioral phases in FSMs and its applications to VLSI test. 462-478 2002 45 Sci. China Ser. F Inf. Sci. 6 https://doi.org/10.1360/02yf9040 db/journals/chinaf/chinaf45.html#LiML02

Yinghua Min Why RTL ATPG? 113-117 2002 17 J. Comput. Sci. Technol. 2 https://doi.org/10.1007/BF02962203 db/journals/jcst/jcst17.html#Min02

Zuying Luo Xiaowei Li 0001 Huawei Li 0001 Shiyuan Yang Yinghua Min Test Power Optimization Techniques for CMOS Circuits. 332-337 2002 conf/ats/2002 Asian Test Symposium https://doi.org/10.1109/ATS.2002.1181733 https://doi.ieeecomputersociety.org/10.1109/ATS.2002.1181733 db/conf/ats/ats2002.html#LoLLYM02

Dafang Zhang 0001 Gaogang Xie Yinghua Min Node Grouping in System-Level Fault Diagnosis. 474-479 2001 16 J. Comput. Sci. Technol. 5 https://doi.org/10.1007/BF02948966 db/journals/jcst/jcst16.html#DafangGY01

Huawei Li 0001 Yinghua Min Zhongcheng Li An RT-Level ATPG Based on Clustering of Circuit States. 213-218 2001 conf/ats/2001 Asian Test Symposium https://doi.org/10.1109/ATS.2001.990284 https://doi.ieeecomputersociety.org/10.1109/ATS.2001.990284 db/conf/ats/ats2001.html#LiML01 Zhigang Yin Yinghua Min Xiaowei Li 0001 An Approach to RTL Fault Extraction and Test Generation. 219-224 2001 conf/ats/2001 Asian Test Symposium https://doi.org/10.1109/ATS.2001.990285 https://doi.ieeecomputersociety.org/10.1109/ATS.2001.990285 db/conf/ats/ats2001.html#YinML01 Xiaowei Li 0001 Huawei Li 0001 Yinghua Min Reducing Power Dissipation during At-Speed Test Application. 116- 2001 conf/dft/2001 DFT https://doi.org/10.1109/DFTVS.2001.966760 https://doi.ieeecomputersociety.org/10.1109/DFTVS.2001.966760 db/conf/dft/dft2001.html#LiLM01

Huawei Li 0001 Zhongcheng Li Yinghua Min Reduction of Number of Paths to be Tested in Delay Testing. 477-485 2000 16 J. Electron. Test. 5 https://doi.org/10.1023/A:1008368615938 https://www.wikidata.org/entity/Q56953879 db/journals/et/et16.html#LiLM00

Lijian Li 0001 Xiaoyang Yu Cheng-Wen Wu Yinghua Min A waveform simulator based on Boolean process. 145-150 2000 conf/ats/2000 Asian Test Symposium https://doi.org/10.1109/ATS.2000.893617 https://doi.ieeecomputersociety.org/10.1109/ATS.2000.893617 db/conf/ats/ats2000.html#LiYWM00 Lijian Li 0001 Yinghua Min An efficient BIST design using LFSR-ROM architecture. 386- 2000 conf/ats/2000 Asian Test Symposium https://doi.org/10.1109/ATS.2000.893654 https://doi.ieeecomputersociety.org/10.1109/ATS.2000.893654 db/conf/ats/ats2000.html#LiM00 Jie Wu 0001 Feng Gao Zhongcheng Li Yinghua Min Optimal Fault-Tolerant Routing in Hypercubes Using Extended Safety Vectors. 264-271 2000 conf/icpads/2000 ICPADS https://doi.org/10.1109/ICPADS.2000.857707 https://doi.ieeecomputersociety.org/10.1109/ICPADS.2000.857707 db/conf/icpads/icpads2000.html#WuGLM00

Yinghua Min Zhongcheng Li An analytical delay model. 97-115 1999 14 J. Comput. Sci. Technol. 2 https://doi.org/10.1007/BF02946516 db/journals/jcst/jcst14.html#MinL99

Jianhui Jiang Hongbao Shi Yinghua Min Xiaodong Zhao A Novel NMR Structure with Concurrent Error Location Capabilities. 32-39 1999 PRDC https://doi.org/10.1109/PRDC.1999.816209 https://doi.ieeecomputersociety.org/10.1109/PRDC.1999.816209 conf/prdc/1999 db/conf/prdc/prdc1999.html#JiangSMZ99

Yinghua Min Zhongcheng Li IDDT Testing versus IDDQ Testing. 51-55 1998 13 J. Electron. Test. 1 https://doi.org/10.1023/A:1008337200506 db/journals/et/et13.html#MinL98

Yingquan Zhou Mike W. T. Wong Yinghua Min On concurrent multiple error diagnosability in linear analog circuits using continuous checksum. 53-64 1998 26 Int. J. Circuit Theory Appl. 1 https://doi.org/10.1002/(SICI)1097-007X(199801/02)26:1<53::AID-CTA990>3.0.CO;2-V db/journals/ijcta/ijcta26.html#ZhouWM98

Zhongcheng Li Yinghua Min Robert K. Brayton A New Low-Cost Method for Identifying Untestable Path Delay Faults. 76-81 1998 conf/ats/1998 Asian Test Symposium https://doi.org/10.1109/ATS.1998.741591 https://doi.ieeecomputersociety.org/10.1109/ATS.1998.741591 db/conf/ats/ats1998.html#LiMB98 Huawei Li 0001 Zhongcheng Li Yinghua Min Delay Testing with Double Observations. 96- 1998 conf/ats/1998 Asian Test Symposium https://doi.org/10.1109/ATS.1998.741597 https://doi.ieeecomputersociety.org/10.1109/ATS.1998.741597 db/conf/ats/ats1998.html#LiLM98

Zhuxing Zhao Yinghua Min Zhongcheng Li Path sensitization. 271-282 1997 12 J. Comput. Sci. Technol. 3 https://doi.org/10.1007/BF02948977 db/journals/jcst/jcst12.html#ZhaoML97

Wangning Long Yinghua Min Shiyuan Yang Shibai Tong Short-time scaling of variable ordering of OBDDs. 366-371 1997 12 J. Comput. Sci. Technol. 4 https://doi.org/10.1007/BF02943155 db/journals/jcst/jcst12.html#LongMYT97

Wangning Long Shiyuan Yang Zhongcheng Li Yinghua Min Memory Efficient ATPG for Path Delay Faults. 326-331 1997 conf/ats/1997 Asian Test Symposium https://doi.org/10.1109/ATS.1997.643978 https://doi.ieeecomputersociety.org/10.1109/ATS.1997.643978 db/conf/ats/ats1997.html#LongYLM97 Xiaoming Yu Yinghua Min Design of delay-verifiable combinational logic by adding extra inputs. 332- 1997 conf/ats/1997 Asian Test Symposium https://doi.org/10.1109/ATS.1997.643979 https://doi.ieeecomputersociety.org/10.1109/ATS.1997.643979 db/conf/ats/ats1997.html#YuM97 Yinghua Min Zhuxing Zhao Zhongcheng Li IDDT Testing. 378-383 1997 conf/ats/1997 Asian Test Symposium https://doi.org/10.1109/ATS.1997.643986 https://doi.ieeecomputersociety.org/10.1109/ATS.1997.643986 db/conf/ats/ats1997.html#MinZL97 Zhongcheng Li Yuhong Zhao Yinghua Min Robert K. Brayton Timed Binary Decision Diagrams. 352-357 1997 conf/iccd/1997 ICCD db/conf/iccd/iccd97.html#LiZMB97 https://doi.org/10.1109/ICCD.1997.628894 https://doi.ieeecomputersociety.org/10.1109/ICCD.1997.628894 Zhongcheng Li Robert K. Brayton Yinghua Min Efficient Identification of Non-Robustly Untestable Path Delay Faults. 992-997 1997 conf/itc/1997 ITC db/conf/itc/itc1997.html#LiBM97 https://doi.org/10.1109/TEST.1997.639715 https://doi.ieeecomputersociety.org/10.1109/TEST.1997.639715

Yingquan Zhou Mike W. T. Wong Yinghua Min Hardware reduction in continuous checksum-based analog checkers: Algorithm and its analysis. 153-163 1996 9 J. Electron. Test. 1-2 https://doi.org/10.1007/BF00137571 db/journals/et/et9.html#ZhouWM96

Yingquan Zhou Yinghua Min A kind of Multistage Interconnection Networks with multiple paths. 395-404 1996 11 J. Comput. Sci. Technol. 4 https://doi.org/10.1007/BF02948483 db/journals/jcst/jcst11.html#ZhouM96

Zhuxing Zhao Zhongcheng Li Yinghua Min Waveform Polynomial Manipulation Using Bdds. 136-141 1996 conf/ats/1996 Asian Test Symposium https://doi.org/10.1109/ATS.1996.555150 https://doi.ieeecomputersociety.org/10.1109/ATS.1996.555150 db/conf/ats/ats1996.html#ZhaoLM96 Yinghua Min Zhuxing Zhao Zhongcheng Li An Analytical Delay Model Based on Boolean Process. 162-165 1996 conf/vlsid/1996 VLSI Design https://doi.org/10.1109/ICVD.1996.489477 https://doi.ieeecomputersociety.org/10.1109/ICVD.1996.489477 db/conf/vlsid/vlsid1996.html#MinZL96

Youli Min Yinghua Min A fault-tolerant and heuristic routing algorithm for faulty hypercubes. 536-544 1995 10 J. Comput. Sci. Technol. 6 https://doi.org/10.1007/BF02943511 db/journals/jcst/jcst10.html#MinM95

Yinghua Min Zhuxing Zhao Zhongcheng Li Boolean process-an analytical approach to circuit representation (II). 26-32 1995 conf/ats/1995 Asian Test Symposium https://doi.org/10.1109/ATS.1995.485312 https://doi.ieeecomputersociety.org/10.1109/ATS.1995.485312 db/conf/ats/ats1995.html#MinZL95 Vishwani D. Agrawal Bernard Courtois Fumiyasu Hirose Sandip Kundu Chung-Len Lee Yinghua Min Parimal Pal Chaudhuri Panel: New Research Problems in the Emerging Test Technology. 189-190 1995 conf/ats/1995 Asian Test Symposium https://doi.ieeecomputersociety.org/10.1109/ATS.1995.10006 db/conf/ats/ats1995.html#AgrawalCHKLMC95 Yingquan Zhou Mike W. T. Wong Yinghua Min Feasibility and Effectiveness of the Algorithm for Overhead Reduction in Analog Checkers. 238-247 1995 conf/ftcs/1995 FTCS db/conf/ftcs/ftcs95.html#ZhouWM95 https://doi.org/10.1109/FTCS.1995.466974 https://doi.ieeecomputersociety.org/10.1109/FTCS.1995.466974 Yinghua Min Yutang Zhou Zhongcheng Li Cheng Ye 0003 Yuqi Pan Behavioral Design and Prototyping of a Fail-Safe System. 159-162 1994 conf/vlsid/1994 VLSI Design db/conf/vlsid/vlsid1994.html#MinZLYP94 https://doi.org/10.1109/ICVD.1994.282676 https://doi.ieeecomputersociety.org/10.1109/ICVD.1994.282676 Yinghua Min Zhongcheng Li Evaluation of test generation algorithms. 348-350 1993 VTS https://doi.org/10.1109/VTEST.1993.313376 https://doi.ieeecomputersociety.org/10.1109/VTEST.1993.313376 conf/vts/1993 db/conf/vts/vts1993.html#MinL93

Yinghua Min Yashwant K. Malaiya Boping Jin Analysis of Detection Capability of Parallel Signature Analyzers. 1075-1081 1991 40 IEEE Trans. Computers 9 db/journals/tc/tc40.html#MinMJ91 https://doi.org/10.1109/12.83655 http://doi.ieeecomputersociety.org/10.1109/12.83655

Yinghua Min Jintao Li Strongly fault secure PLAs and totally self-checking checkers. 863-867 1988 37 IEEE Trans. Computers 6 https://doi.org/10.1109/12.2233 db/journals/tc/tc37.html#MinL88

Yinghua Min Zhongcheng Li Pseudo-Exhaustive Testing Strategy for Large Combinational Circuits. 213-220 1986 1 Comput. Syst. Sci. Eng. 4 db/journals/csse/csse1.html#MinL86

Yinghua Min Stephen Y. H. Su Testing functional faults in VLSI. 384-392 1982 DAC https://doi.org/10.1145/800263.809234 conf/dac/1982 db/conf/dac/dac1982.html#MinS82 Jacob Abraham Vishwani D. Agrawal Robert K. Brayton Parimal Pal Chaudhuri Alberto Conte Bernard Courtois Debesh Kumar DasDebesh K. Das Xiaodong Duan Hideo Fujiwara Feng Gao Fumiyasu Hirose Valérie Issarny Jianhui Jiang Boping Jin Jishun Kuang Sandip Kundu Chung-Len Lee Huawei Li 0001 Jintao Li Lijian Li 0001 Xiaowei Li 0001 Yungang Li Zhongcheng Li Huaguo Liang Wangning Long Yuan-sheng Luo Zuying Luo Michael R. Lyu Yashwant K. Malaiya Youli Min Salvador Mir Xiaoyan Niu Yuqi Pan Chenglian Peng Hongbao Shi Stephen Y. H. Su Shibai Tong Jeremy Wang Jie Wang Jigang Wen Mike W. T. Wong Cheng-Wen Wu Jie Wu 0001 Gaogang Xie Kun Xie 0001 Shiyi Xu Jianhua Yang Shiyuan Yang Zhiqiang Yang Cheng Ye 0003 Zhigang Yin Xiaoming Yu Xiaoyang Yu Da-Fang ZhangDafang Zhang Da-Fang Zhang 0001Dafang Zhang 0001 Guangxing Zhang Ying Zhang 0040 Ruilian Zhao Xiaodong Zhao Yuhong Zhao Zhuxing Zhao Yingquan Zhou Yutang Zhou Zhaomin Zhou Qijian Zhu Yervant Zorian