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Dorothy June M. Hamada

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Journal Articles

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2018
[j5]
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  - journals/mr/RoeschH18
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William J. Roesch, Dorothy June M. Hamada:
Discovering and reducing defects in MIM capacitors. Microelectron. Reliab. 81: 299-305 (2018)
2012
[j4]
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William J. Roesch, Dorothy June M. Hamada, David Littleton:
Introducing a scale structure to correlate quality and reliability. Microelectron. Reliab. 52(1): 16-22 (2012)
2011
[j3]
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David Littleton, Dorothy June M. Hamada, William J. Roesch:
Drainage ratio impact on void creation in gold interconnect. Microelectron. Reliab. 51(2): 240-245 (2011)
2008
[j2]
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Dorothy June M. Hamada, William J. Roesch:
A wafer-level approach to device lifetesting. Microelectron. Reliab. 48(7): 985-989 (2008)
2005
[j1]
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William J. Roesch, Dorothy June M. Hamada:
Metal defect yield and reliability relationships. Microelectron. Reliab. 45(12): 1875-1881 (2005)

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