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M. Elangovan
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2020 – today
- 2024
- [j13]M. Elangovan, Kulbhushan Sharma
, Ashish Sachdeva
Read Improved and Low Leakage Power CNTFET Based Hybrid 10t SRAM Cell for Low Power Applications. Circuits Syst. Signal Process. 43(3): 1627-1660 (2024) - 2023
- [j12]A. Venkatesan
Diode Connected Transistor-Based Low PDP Adiabatic Full Adder in 7 nm FINFET Technology for MIMO Applications. J. Circuits Syst. Comput. 32(8): 2350134:1-2350134:19 (2023) - [j11]A. Venkatesan, P. T. Vanathi, M. Elangovan:
Erratum: Diode Connected Transistor-Based Low PDP Adiabatic Full Adder in 7nm FINFET Technology for MIMO Applications. J. Circuits Syst. Comput. 32(13): 2392003:1 (2023) - [j10]M. Elangovan
High-Stability and High-Speed 11T CNTFET SRAM Cell for MIMO Applications. J. Circuits Syst. Comput. 32(17): 2350291:1-2350291:23 (2023) - 2022
- [j9]M. Elangovan
A Low-Power and High-Stability 8T SRAM Cell with Diode-Connected Transistors. J. Circuits Syst. Comput. 31(8): 2250154:1-2250154:30 (2022) - [j8]M. Elangovan
Design of High Stability and Low Power 7T SRAM Cell in 32-NM CNTFET Technology. J. Circuits Syst. Comput. 31(13): 2250233:1-2250233:23 (2022) - 2021
- [j7]M. Elangovan:
A Novel Darlington-Based 8T CNTFET SRAM Cell for Low Power Applications. J. Circuits Syst. Comput. 30(12): 2150213:1-2150213:17 (2021) - 2020
- [j6]M. Elangovan
High Stable and Low Power 8T CNTFET SRAM Cell. J. Circuits Syst. Comput. 29(5): 2050080:1-2050080:18 (2020) - [j5]M. Elangovan
High Stable and Low Power 10T CNTFET SRAM Cell. J. Circuits Syst. Comput. 29(10): 2050158:1-2050158:19 (2020)
2010 – 2019
- 2014
- [j4]Sanidhya Painuli
Tool condition monitoring using K-star algorithm. Expert Syst. Appl. 41(6): 2638-2643 (2014) - 2011
- [j3]M. Elangovan, S. Babu Devasenapati, N. R. Sakthivel
Evaluation of expert system for condition monitoring of a single point cutting tool using principle component analysis and decision tree algorithm. Expert Syst. Appl. 38(4): 4450-4459 (2011) - [j2]M. Elangovan, V. Sugumaran
Effect of SVM kernel functions on classification of vibration signals of a single point cutting tool. Expert Syst. Appl. 38(12): 15202-15207 (2011) - 2010
- [j1]M. Elangovan, K. I. Ramachandran, V. Sugumaran
Studies on Bayes classifier for condition monitoring of single point carbide tipped tool based on statistical and histogram features. Expert Syst. Appl. 37(3): 2059-2065 (2010)
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