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"Optimized Stress Testing for Flexible Hybrid Electronics Designs."

Hang Gao et al. (2019)

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DOI: 10.1109/VTS.2019.8758661

access: closed

type: Conference or Workshop Paper

metadata version: 2024-02-05

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  dblp key:
  - conf/vts/GaoBOO19
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Hang Gao, Ganapati Bhat, Ümit Y. Ogras, Sule Ozev:
Optimized Stress Testing for Flexible Hybrid Electronics Designs. VTS 2019: 1-6

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