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"A Two-step Thresholding Algorithm for Image-based Defect Detection in ..."

Wei-Tai Chen et al. (2018)

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DOI: 10.23919/ACC.2018.8431596

access: closed

type: Conference or Workshop Paper

metadata version: 2021-01-21

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  dblp key:
  - conf/amcc/ChenCYC18
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  - https://dblp.org/rec/conf/amcc/ChenCYC18
Wei-Tai Chen, Reaz A. Chowdhury, Jeffrey Youngblood, George T.-C. Chiu:
A Two-step Thresholding Algorithm for Image-based Defect Detection in Roll-to-Roll Coating of Cellulose Nanocrystal Films. ACC 2018: 4440-4445

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