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"Improved Model for ESD Failure Caused by Stressing No Connect Pin."

Jingrui Ma et al. (2019)

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DOI: 10.1109/ASICON47005.2019.8983554

access: closed

type: Conference or Workshop Paper

metadata version: 2020-10-25

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  dblp key:
  - conf/asicon/MaXWC19
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  - https://dblp.org/rec/conf/asicon/MaXWC19
Jingrui Ma, Qi-An Xu, Blacksmith Wu, Kanyu Cao:
Improved Model for ESD Failure Caused by Stressing No Connect Pin. ASICON 2019: 1-4

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