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"Temporal performance degradation under NBTI: estimation and design for ..."

Bipul Chandra Paul et al. (2006)

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DOI: 10.1109/DATE.2006.244119

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Bipul Chandra Paul, Kunhyuk Kang, Haldun Kufluoglu, Muhammad Ashraful Alam, Kaushik Roy:
Temporal performance degradation under NBTI: estimation and design for improved reliability of nanoscale circuits. DATE 2006: 780-785

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