default search action
"Sampling-based buffer insertion for post-silicon yield improvement under ..."
Grace Li Zhang, Bing Li, Ulf Schlichtmann (2016)
- Grace Li Zhang
, Bing Li, Ulf Schlichtmann:
Sampling-based buffer insertion for post-silicon yield improvement under process variability. DATE 2016: 1457-1460
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.