default search action

combined dblp search
author search
venue search
publication search

ask others

Google
Google Scholar
Semantic Scholar
Internet Archive Scholar
CiteSeerX
ORCID

"2nd IEEE International Workshop on Electronic Design, Test and ..."

> Home

Details and statistics

DOI: —

access: closed

type: Editorship

metadata version: 2019-10-16

- view
- export record
  dblp key:
  - conf/delta/2004
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/delta/2004
2nd IEEE International Workshop on Electronic Design, Test and Applications (DELTA 2004), 28-30 January 2004, Perth, Australia. IEEE Computer Society 2004, ISBN 0-7695-2081-2 [contents]

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.