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"Test Cost Saving and Challenges in the Implementation of x6 and x8 ..."

Lew Boon Kian (2006)

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DOI: 10.1109/DELTA.2006.85

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Lew Boon Kian:
Test Cost Saving and Challenges in the Implementation of x6 and x8 Parallel Testing on Freescale 16-bit HCS12 Micro-controller Product Family. DELTA 2006: 74-82

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