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"Resistive Switching Early Failure and Gap Identification in Bilayer ..."

Ying-Chen Chen et al. (2019)

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DOI: 10.1109/DRC46940.2019.9046451

access: closed

type: Conference or Workshop Paper

metadata version: 2020-04-03

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Ying-Chen Chen, Szu-Tung Hu, Chao-Cheng Lin, Jack C. Lee:
Resistive Switching Early Failure and Gap Identification in Bilayer Selectorless RRAM Applications. DRC 2019: 89-90

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