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"Reliability of capacitive RF MEMS switches subjected to repetitive impact ..."

Marco Barbato et al. (2014)

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DOI: 10.1109/ESSDERC.2014.6948760

access: closed

type: Conference or Workshop Paper

metadata version: 2023-01-25

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Marco Barbato, Andrea Cester, Viviana Mulloni, Benno Margesin, Giorgio De Pasquale, Aurelio Somà, Gaudenzio Meneghesso:
Reliability of capacitive RF MEMS switches subjected to repetitive impact cycles at different temperatures. ESSDERC 2014: 70-73

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