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"Make Big Data Applications More Reliable: Hitless vSDN Migration to Avoid ..."

Sicheng Zhao et al. (2018)

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DOI: 10.1109/ICC.2018.8422441

access: closed

type: Conference or Workshop Paper

metadata version: 2021-01-05

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  - conf/icc/ZhaoJHYZ18
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Sicheng Zhao, Yao Jin, Kai Han, Jie Yin, Zuqing Zhu:
Make Big Data Applications More Reliable: Hitless vSDN Migration to Avoid TCAM Depletion. ICC 2018: 1-6

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