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"A Bidirectional ESD Protection Circuit With High Reliability and Low ..."

Chun-Cheng Chen, Chun-Yu Lin (2024)

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DOI: 10.1109/ICCE-TAIWAN62264.2024.10674456

access: closed

type: Conference or Workshop Paper

metadata version: 2025-04-03

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Chun-Cheng Chen, Chun-Yu Lin:
A Bidirectional ESD Protection Circuit With High Reliability and Low Leakage for Consumer Electronic Products. ICCE-Taiwan 2024: 793-794

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