default search action

combined dblp search
author search
venue search
publication search

ask others

"Scenario Based Testing & Test Plan Metrics Based on a Use Case ..."

Robert Young Chul Kim et al. (2003)

> Home

Details and statistics

DOI: 10.1007/3-540-44843-8_71

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-24

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/iccsa/KimJKJ03
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/iccsa/KimJKJ03
Robert Young Chul Kim, Bok-Gyu Joo, Kyung-Chul Kim, Byung-kook Joen:
Scenario Based Testing & Test Plan Metrics Based on a Use Case Approach for Real Time UPS (Uninterruptible Power System). ICCSA (2) 2003: 646-655

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.