"PVT variability analysis of FinFET and CMOS XOR circuits at 16nm."

Fábio G. R. G. da Silva, Paulo F. Butzen, Cristina Meinhardt (2016)

Details and statistics

DOI: 10.1109/ICECS.2016.7841255

access: closed

type: Conference or Workshop Paper

metadata version: 2022-10-05

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