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"On-Chip Process Variation Sensor Based on Sub-Threshold Leakage Current ..."

Shengkai Lyu, Zheng Shi (2019)

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DOI: 10.1109/ICICDT.2019.8790891

access: closed

type: Conference or Workshop Paper

metadata version: 2019-10-18

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  - conf/icicdt/LyuS19
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Shengkai Lyu, Zheng Shi:
On-Chip Process Variation Sensor Based on Sub-Threshold Leakage Current with Weak Bias Voltages. ICICDT 2019: 1-4

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