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"Detecting defects in repeatedly patterned image with spatially different ..."

Deokyoung Kang, Hae Na Lee, Suk I. Yoo (2014)

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DOI: 10.1109/ICIP.2014.7025659

access: closed

type: Conference or Workshop Paper

metadata version: 2024-12-23

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Deokyoung Kang, Hae Na Lee, Suk I. Yoo:
Detecting defects in repeatedly patterned image with spatially different level of noise. ICIP 2014: 3258-3262

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