default search action

combined dblp search
author search
venue search
publication search

ask others

"Investigation of Scaling Effect of Copper Microwire Based on in-Situ ..."

Haojian Lu et al. (2018)

> Home

Details and statistics

DOI: 10.1109/ICRA.2018.8460573

access: closed

type: Conference or Workshop Paper

metadata version: 2019-10-19

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/icra/LuXWS18
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/icra/LuXWS18
Haojian Lu, Fengmei Xue, Wenfeng Wan, Yajing Shen:
Investigation of Scaling Effect of Copper Microwire Based on in-Situ Nanorobotic Twisting Inside SEM. ICRA 2018: 1-9

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.