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"Accurate analog/RF BIST evaluation based on SVM classification of the ..."

Ahcène Bounceur et al. (2014)

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DOI: 10.1109/IDT.2014.7038587

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-24

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Ahcène Bounceur, Belkacem Brahmi, Kamel Beznia, Reinhardt Euler:
Accurate analog/RF BIST evaluation based on SVM classification of the process parameters. IDT 2014: 55-60

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