BibTeX record conf/iecon/ChandraYSMPPS20

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@inproceedings{DBLP:conf/iecon/ChandraYSMPPS20,
  author       = {Rohit Chandra and
                  Naga Brahmendra Yadav Gorla and
                  Aravinth Subramaniam and
                  Hasmat Malik and
                  Sanjib Kumar Panda and
                  Kameshwar Poolla and
                  Costas J. Spanos},
  title        = {A Survey of Failure Mechanisms and Statistics for Critical Electrical
                  Equipment in Buildings},
  booktitle    = {The 46th Annual Conference of the {IEEE} Industrial Electronics Society,
                  {IECON} 2020, Singapore, October 18-21, 2020},
  pages        = {1955--1961},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/IECON43393.2020.9254225},
  doi          = {10.1109/IECON43393.2020.9254225},
  timestamp    = {Mon, 03 Mar 2025 21:12:00 +0100},
  biburl       = {https://dblp.org/rec/conf/iecon/ChandraYSMPPS20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}