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"Physical Layer Authentication Based on Residual Network for Industrial ..."

Fei Pan et al. (2020)

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DOI: 10.1109/IECON43393.2020.9255291

access: closed

type: Conference or Workshop Paper

metadata version: 2020-11-23

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Fei Pan, Xiaofan Li, Haibo Pu, Yan Guo, Jiangchuan Liu:
Physical Layer Authentication Based on Residual Network for Industrial Wireless CPSs. IECON 2020: 4368-4373

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