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"Investigation on the short-circuit behavior of an aged IGBT module through ..."

Rui Wu et al. (2014)

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DOI: 10.1109/IECON.2014.7048996

access: closed

type: Conference or Workshop Paper

metadata version: 2019-06-02

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Rui Wu, Liudmila Smirnova, Francesco Iannuzzo, Huai Wang, Frede Blaabjerg:
Investigation on the short-circuit behavior of an aged IGBT module through a 6 kA/1.1 kV non-destructive testing equipment. IECON 2014: 3367-3373

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