default search action

combined dblp search
author search
venue search
publication search

ask others

"A soft measurement of small out-line transistor in surface mount technology."

Chao Xu et al. (2017)

> Home

Details and statistics

DOI: 10.1109/IECON.2017.8217198

access: closed

type: Conference or Workshop Paper

metadata version: 2022-10-02

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/iecon/XuBZH17
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/iecon/XuBZH17
Chao Xu, Lifei Bai, Zhihao Zhang, Boxuan Han:
A soft measurement of small out-line transistor in surface mount technology. IECON 2017: 6855-6858

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.