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"Low-Cost Linearity Testing of High-Resolution ADCs Using Segmentation ..."

Dengquan Li et al. (2024)

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DOI: 10.1109/ISCAS58744.2024.10558217

access: closed

type: Conference or Workshop Paper

metadata version: 2024-07-16

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  dblp key:
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Dengquan Li, Yexin Zhu, Longsheng Wang, Shubin Liu, Zhangming Zhu:
Low-Cost Linearity Testing of High-Resolution ADCs Using Segmentation Modeling and Partial Polynomial Fitting. ISCAS 2024: 1-4

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