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"Reducing Temperature Induced Unreliability in Sub-Threshold Strong PUFs ..."

Nimesh Shah et al. (2020)

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DOI: 10.1109/ISCAS45731.2020.9180596

access: closed

type: Conference or Workshop Paper

metadata version: 2022-01-03

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  dblp key:
  - conf/iscas/ShahBCB20
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Nimesh Shah, Sumon Kumar Bose, Chip-Hong Chang, Arindam Basu:
Reducing Temperature Induced Unreliability in Sub-Threshold Strong PUFs through Circuit Modeling. ISCAS 2020: 1-5

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