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"A comprehensive model for gate delay under process variation and different ..."

Mingzhi Gao et al. (2010)

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DOI: 10.1109/ISQED.2010.5450543

access: closed

type: Conference or Workshop Paper

metadata version: 2022-10-13

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  - conf/isqed/GaoYPWY10
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Mingzhi Gao, Zuochang Ye, Yao Peng, Yan Wang, Zhiping Yu:
A comprehensive model for gate delay under process variation and different driving and loading conditions. ISQED 2010: 406-412

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