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"Reliability Characterization of Logic-Compatible NAND Flash Memory based ..."

Minsu Kim, Jeehwan Song, Chris H. Kim (2020)

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DOI: 10.1109/IRPS45951.2020.9129148

access: closed

type: Conference or Workshop Paper

metadata version: 2020-07-30

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  - conf/irps/KimSK20
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Minsu Kim, Jeehwan Song, Chris H. Kim:
Reliability Characterization of Logic-Compatible NAND Flash Memory based Synapses with 3-bit per Cell Weights and 1μA Current Steps. IRPS 2020: 1-4

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