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"Characterization and Analysis of RF Switches in SOI Technology for ESD ..."

Jian Liu, Nathaniel Carels, Nathaniel Peachey (2022)

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DOI: 10.1109/IRPS48227.2022.9764421

access: closed

type: Conference or Workshop Paper

metadata version: 2022-05-09

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  - conf/irps/LiuCP22
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Jian Liu, Nathaniel Carels, Nathaniel Peachey:
Characterization and Analysis of RF Switches in SOI Technology for ESD Protection. IRPS 2022: 13-1

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