default search action

combined dblp search
author search
venue search
publication search

ask others

"Impact of X-Ray Radiation on the Reliability of Logic Integrated Circuits."

Somayyeh Rahimi et al. (2020)

> Home

Details and statistics

DOI: 10.1109/IRPS45951.2020.9128356

access: closed

type: Conference or Workshop Paper

metadata version: 2020-08-18

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/irps/RahimiSLMS20
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/irps/RahimiSLMS20
Somayyeh Rahimi, Christian Schmidt, Joy Y. Liao, Howard Lee Marks, Kyung Mo Shin:
Impact of X-Ray Radiation on the Reliability of Logic Integrated Circuits. IRPS 2020: 1-4

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.