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"The Role of RF Operational Life Testing in Evaluating III-V Devices ..."

Elias Reese (2020)

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DOI: 10.1109/IRPS45951.2020.9128321

access: closed

type: Conference or Workshop Paper

metadata version: 2020-07-30

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Elias Reese:
The Role of RF Operational Life Testing in Evaluating III-V Devices Addressing RF Through Millimeter-wave Applications. IRPS 2020: 1-4

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