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"Constant-Gate-Charge Scaling for Increased Short-Circuit Withstand Time in ..."

Madankumar Sampath, Dallas T. Morisette, James A. Cooper (2020)

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DOI: 10.1109/IRPS45951.2020.9128220

access: closed

type: Conference or Workshop Paper

metadata version: 2022-01-03

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Madankumar Sampath, Dallas T. Morisette, James A. Cooper:
Constant-Gate-Charge Scaling for Increased Short-Circuit Withstand Time in SiC Power Devices. IRPS 2020: 1-4

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