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"Backside Alpha-Irradiation Test in Flip-Chip Package in EUV 7 nm FinFET SRAM."

Taiki Uemura et al. (2020)

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DOI: 10.1109/IRPS45951.2020.9129331

access: closed

type: Conference or Workshop Paper

metadata version: 2020-11-24

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  dblp key:
  - conf/irps/UemuraCJJJJRLRP20
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  - https://dblp.org/rec/conf/irps/UemuraCJJJJRLRP20
Taiki Uemura, Byungjin Chung, Jeongmin Jo, Hai Jiang, Yongsung Ji, Tae-Young Jeong, Rakesh Ranjan, Seungbae Lee, Hwasung Rhee, Sangwoo Pae, Euncheol Lee, Jaehee Choi, Shota Ohnishi, Ken Machida:
Backside Alpha-Irradiation Test in Flip-Chip Package in EUV 7 nm FinFET SRAM. IRPS 2020: 1-4

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