default search action

combined dblp search
author search
venue search
publication search

ask others

"Circuit Reliability Analysis of RRAM-based Logic-in-Memory Crossbar ..."

Tommaso Zanotti, Francesco Maria Puglisi, Paolo Pavan (2020)

> Home

Details and statistics

DOI: 10.1109/IRPS45951.2020.9128343

access: closed

type: Conference or Workshop Paper

metadata version: 2024-05-07

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/irps/ZanottiPP20
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/irps/ZanottiPP20
Tommaso Zanotti, Francesco Maria Puglisi, Paolo Pavan:
Circuit Reliability Analysis of RRAM-based Logic-in-Memory Crossbar Architectures Including Line Parasitic Effects, Variability, and Random Telegraph Noise. IRPS 2020: 1-5

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.