default search action

combined dblp search
author search
venue search
publication search

ask others

"Correlation of Dielectric Breakdown and Nanoscale Adhesion in Silicon ..."

Alok Ranjan et al. (2020)

> Home

Details and statistics

DOI: 10.1109/IRPS45951.2020.9128353

access: closed

type: Conference or Workshop Paper

metadata version: 2024-02-05

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/irps/0001OBMRP20
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/irps/0001OBMRP20
Alok Ranjan, Sean J. O'Shea, Michel Bosman, J. Molina, Nagarajan Raghavan, Kin Leong Pey:
Correlation of Dielectric Breakdown and Nanoscale Adhesion in Silicon Dioxide Thin Films. IRPS 2020: 1-7

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.