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"2011 IEEE International Test Conference, ITC 2011, Anaheim, CA, USA, ..."

Bill Eklow, R. D. (Shawn) Blanton (2011)

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DOI: —

access: closed

type: Editorship

metadata version: 2019-10-16

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Bill Eklow, R. D. (Shawn) Blanton:
2011 IEEE International Test Conference, ITC 2011, Anaheim, CA, USA, September 20-22, 2011. IEEE Computer Society 2011, ISBN 978-1-4577-0153-5 [contents]

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