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"Doing more with less - An IEEE 1149.7 embedded tutorial : Standard for ..."

Adam W. Ley (2009)

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DOI: 10.1109/TEST.2009.5355572

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Adam W. Ley:
Doing more with less - An IEEE 1149.7 embedded tutorial : Standard for reduced-pin and enhanced-functionality test access port and boundary-scan architecture. ITC 2009: 1-10

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