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"Modeling and Evaluation of the Interconnection-driven Repairability for ..."

B. Jang et al. (2003)

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type: Conference or Workshop Paper

metadata version: 2015-11-17

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  dblp key:
  - conf/mic/JangPGH03
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B. Jang, Nohpill Park, K. M. George, George E. Hedrick:
Modeling and Evaluation of the Interconnection-driven Repairability for Distributed Embedded Memory Cores on Chip. Modelling, Identification and Control 2003: 403-408

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