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"The best of both worlds: integrating semantic features with expert ..."

Chao Ni et al. (2022)

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DOI: 10.1145/3540250.3549165

access: closed

type: Conference or Workshop Paper

metadata version: 2023-06-12

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  - conf/sigsoft/Ni0Y0L022
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Chao Ni, Wei Wang, Kaiwen Yang, Xin Xia, Kui Liu, David Lo:
The best of both worlds: integrating semantic features with expert features for defect prediction and localization. ESEC/SIGSOFT FSE 2022: 672-683

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