default search action

combined dblp search
author search
venue search
publication search

ask others

"Investigation of Negative Bias Temperature Instability Effect in Partially ..."

Chao Peng et al. (2020)

> Home

Details and statistics

DOI: 10.1109/ACCESS.2020.2997463

access: open

type: Journal Article

metadata version: 2023-06-26

- view
  - electronic edition via DOI (open access)
  authority control:
- export record
  dblp key:
  - journals/access/PengLGZCEH20
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/access/PengLGZCEH20
Chao Peng, Zhifeng Lei, Rui Gao, Zhangang Zhang, Yiqiang Chen, Yunfei En, Yun Huang:
Investigation of Negative Bias Temperature Instability Effect in Partially Depleted SOI pMOSFET. IEEE Access 8: 99037-99046 (2020)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.