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"Reliability of Functional Connectivity of Electroencephalography Applying ..."

Florian Hatz et al. (2016)

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DOI: 10.1089/BRAIN.2015.0368

access: closed

type: Journal Article

metadata version: 2020-03-12

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  - journals/brain/HatzHBRSF16
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  - https://dblp.org/rec/journals/brain/HatzHBRSF16
Florian Hatz, Martin Hardmeier, Habib Bousleiman, Stephan Rüegg, Christian Schindler, Peter Fuhr:
Reliability of Functional Connectivity of Electroencephalography Applying Microstate-Segmented Versus Classical Calculation of Phase Lag Index. Brain Connect. 6(6): 461-469 (2016)

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