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"Repurposing FPGAs for Tester Design to Enhance Field-Testing in a 3D Stack."

Yi Sun et al. (2019)

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DOI: 10.1007/S10836-019-05845-5

access: closed

type: Journal Article

metadata version: 2025-01-19

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  dblp key:
  - journals/et/SunZJNDMB19
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  - https://dblp.org/rec/journals/et/SunZJNDMB19
Yi Sun, Fanchen Zhang, Hui Jiang, Kundan Nepal, Jennifer Dworak, Theodore W. Manikas, R. Iris Bahar:
Repurposing FPGAs for Tester Design to Enhance Field-Testing in a 3D Stack. J. Electron. Test. 35(6): 887-900 (2019)

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