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"Multi-Step-Ahead Prediction for a CMOS Low Noise Amplifier Aging Due to ..."

Chuang Yang, Feng Feng (2019)

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DOI: 10.1007/S10836-019-05843-7

access: closed

type: Journal Article

metadata version: 2020-09-11

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Chuang Yang, Feng Feng:
Multi-Step-Ahead Prediction for a CMOS Low Noise Amplifier Aging Due to NBTI and HCI Using Neural Networks. J. Electron. Test. 35(6): 797-808 (2019)

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