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"Enhancing supervised bug localization with metadata and stack-trace."

Yaojing Wang et al. (2020)

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DOI: 10.1007/S10115-019-01426-2

access: closed

type: Journal Article

metadata version: 2023-10-22

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  dblp key:
  - journals/kais/WangYTHLXL20
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  - https://dblp.org/rec/journals/kais/WangYTHLXL20
Yaojing Wang, Yuan Yao, Hanghang Tong, Xuan Huo, Ming Li, Feng Xu, Jian Lu:
Enhancing supervised bug localization with metadata and stack-trace. Knowl. Inf. Syst. 62(6): 2461-2484 (2020)

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