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"Artificial neural network-based metric selection for software fault-prone ..."

Cong Jin, Shu-Wei Jin, J.-M. Ye (2012)

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DOI: 10.1049/IET-SEN.2011.0138

access: closed

type: Journal Article

metadata version: 2020-05-22

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Cong Jin, Shu-Wei Jin, J.-M. Ye:
Artificial neural network-based metric selection for software fault-prone prediction model. IET Softw. 6(6): 479-487 (2012)

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