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"Electrical Characterization of Nano-Floating Gated Silicon-on-Insulator ..."

Dong-Uk Lee et al. (2008)

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DOI: 10.1093/IETELE/E91-C.5.747

access: closed

type: Journal Article

metadata version: 2020-04-11

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Dong-Uk Lee, Seon Pil Kim, Tae Hee Lee, Eun Kyu Kim, Hyun-Mo Koo, Won-Ju Cho, Young-Ho Kim:
Electrical Characterization of Nano-Floating Gated Silicon-on-Insulator Memory with In₂O₃ Nano-Particles Embedded in Polyimide Insulator. IEICE Trans. Electron. 91-C(5): 747-750 (2008)

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