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"Hybrid Pattern BIST for Low-Cost Core Testing Using Embedded FPGA Core."

Gang Zeng, Hideo Ito (2005)

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DOI: 10.1093/IETISY/E88-D.5.984

access: closed

type: Journal Article

metadata version: 2020-04-11

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Gang Zeng, Hideo Ito:
Hybrid Pattern BIST for Low-Cost Core Testing Using Embedded FPGA Core. IEICE Trans. Inf. Syst. 88-D(5): 984-992 (2005)

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