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"Cell placement of MCM for reliability optimization."

Joonyun Kim (2010)

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DOI: 10.1587/ELEX.7.1796

access: open

type: Journal Article

metadata version: 2021-02-12

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  - journals/ieiceee/Kim10
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  - https://dblp.org/rec/journals/ieiceee/Kim10
Joonyun Kim:
Cell placement of MCM for reliability optimization. IEICE Electron. Express 7(24): 1796-1801 (2010)

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