default search action

combined dblp search
author search
venue search
publication search

ask others

"UnionMixup and max-min-saliency mixup for mixed-type defect recognition of ..."

Qingqing Yu (2024)

> Home

Details and statistics

DOI: 10.1587/ELEX.21.20240054

access: open

type: Journal Article

metadata version: 2024-11-27

- view
  - electronic edition via DOI (open access)
  authority control:
- export record
  dblp key:
  - journals/ieiceee/Yu24
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/ieiceee/Yu24
Qingqing Yu:
UnionMixup and max-min-saliency mixup for mixed-type defect recognition of wafer bin maps. IEICE Electron. Express 21(10): 20240054 (2024)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.