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"Intelligent Test Plan Metrics on Adaptive Use Case Approach."

Robert Young Chul Kim, Jaehyub Lee (2002)

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DOI: 10.5391/IJFIS.2002.2.1.070

access: closed

type: Journal Article

metadata version: 2020-07-03

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Robert Young Chul Kim, Jaehyub Lee:
Intelligent Test Plan Metrics on Adaptive Use Case Approach. Int. J. Fuzzy Log. Intell. Syst. 2(1): 70-77 (2002)

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